Publication:

Challenges in scaling of CMOS devices towards 65nm node

Date

2003-06

Proceedings Paper

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Author(s)

;

Veloso, Anabela

;

Rooyackers, Rita

;

Augendre, Emmanuel

;

;

Rothschild, Aude

;

Schaekers, Marc

;

Lindsay, Richard

;

;

Henson, Kirklen

;

;

Pollentier, Ivan

;

De Keersgieter, An

Statistics

1927 since deposited on 2021-10-15

Acq. date: 2026-05-29