Publication:

Scaling Cu/SiCN Wafer-to-Wafer Hybrid Bonding down to 400 nm interconnect pitch

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374 since deposited on 2024-12-07
16last month
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Acq. date: 2026-08-18

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Views

374 since deposited on 2024-12-07
16last month
6last week
Acq. date: 2026-08-18

Citations