Publication:
Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
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1929 since deposited on 2021-10-18
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Acq. date: 2026-10-12
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Statistics
Views
1929 since deposited on 2021-10-18
2last month
2last week
Acq. date: 2026-10-12
Citations