Publication:
EUV mask repair using a combination of focused-electron-beam-induced processing and vacuum Atomic Force Microscopy
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1938 since deposited on 2021-10-19
1last month
Acq. date: 2026-05-30
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Statistics
Views
1938 since deposited on 2021-10-19
1last month
Acq. date: 2026-05-30
Citations