Publication:
Experimental and theoretical verification of channel conductivity degradation due to grain boundaries and defects in 3D NAND
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1963 since deposited on 2021-10-24
2last month
Acq. date: 2026-06-05
Citations
Statistics
Views
1963 since deposited on 2021-10-24
2last month
Acq. date: 2026-06-05
Citations