Publication:

The defect-centric perspective of device and circuit reliability – from individual defects to circuits

Date

2015

Proceedings Paper

Simple item page Full metadata Statistics

Files

33143.pdf 1.3 MB

Author(s)

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Roussel, Philippe

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Degraeve, Robin

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Linten, Dimitri

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Groeseneken, Guido

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Raghavan, Praveen

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Catthoor, Francky

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Statistics

1918 since deposited on 2021-10-22

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Acq. date: 2026-06-01