Identification of Electrically Stressed Regions in AlGaN/GaN-on-Si Schottky Barrier Diode Using EBIC Technique

Publication:

2021

Journal article

Author(s)

;

;

;

;

;

IEEE TRANSACTIONS ON ELECTRON DEVICES

1911 since deposited on 2022-02-25

1last month

Acq. date: 2026-10-13