Publication:
Implementing cubic-phase HfO2 with $j-value ~ 30 in low-VT replacementgate pMOS devices for improved EOT-Scaling and reliability
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1881 since deposited on 2021-10-20
2last month
Acq. date: 2026-06-02
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Statistics
Views
1881 since deposited on 2021-10-20
2last month
Acq. date: 2026-06-02
Citations