Browsing by Author "Liu, Hsien-Yang"

Comprehensive Investigation of Constant Voltage Stress Time-Dependent Breakdown and Cycle-to-Breakdown Reliability in Y-Doped and Si-Doped HfO2 Metal-Ferroelectric-Metal Memory

Investigation of TiO2 seed layer engineering for improved remanent polarization uniformity, TDDB reliability, and dipole switching in La-doped ferroelectric HZO MFM devices