Browsing by Author "Lin, Tzu-Heng"
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Publication Reverse Gate Leakage Induced Buffer Charging and Threshold Voltage Shift of GaN HEMTs
; ; ; ; ; Publication Threshold Voltage Bias Temperature Instability of RF MIS-HEMTs and Schottky HEMTs Under Semi-On State Stress
Journal article2025, IEEE TRANSACTIONS ON ELECTRON DEVICES, (72) 10, p.5359-5365