Browsing by Author "Vander Meeren, N."
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Publication Achieving 1ppm write-error rate in SOT-MRAM with synthetic antiferromagnetic free layer
Proceedings paper2024, IEEE International Electron Devices Meeting (IEDM), 2024-12-07Publication Magnetic immunity of STT-MRAM: external magnetic field orientation impact on writing reliability
Proceedings paper2024, IEEE International Electron Devices Meeting (IEDM), 2024-12-07