Browsing by Author "Stampfl, F."
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Publication CV Characterization of Si/SiGe heterostructures at Cryo Temperatures
; ; ; ; Proceedings paper2025, IEEE International Reliability Physics Symposium (IRPS), 2025-03-30Publication Defect-centric modeling of capacitance-voltage characteristics of SiGe/Si/SiGe heterostructures at cryogenic temperatures
Proceedings paper2025, IEEE International Integrated Reliability Workshop (IIRW), 2025-10-05Publication Terman method to study threshold voltage hysteresis of Si/SiGe heterostructures at cryogenic temperatures
Proceedings paper2026, IEEE International Reliability Physics Symposium (IRPS), 2026-03-22, p.1-6