Browsing by Author "Liu, C."

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Modeling the Performance and Reliability of Two-Dimensional Semiconductor Transistors

Knobloch, T.
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Waldhoer, D.
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Davoudi, M. R.
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Karl, A.
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Khakbaz, P.
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Matzinger, M.
;
Zhang, Y.
Proceedings paper
2023, International Electron Devices Meeting (IEDM), 2023-12-09
Process control & integration options of RMG Technology for aggressively scaled devices

Veloso, Anabela
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Higuchi, Yuichi
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Chew, Soon Aik
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Devriendt, Katia
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Ragnarsson, Lars-Ake
Proceedings paper
2012, Symposium on VLSI Technology - VLSIT, 12/06/2012, p.33-34