Browsing by Author "Ghyselen, B."
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Publication Improved device reliability for strain-balanced InP HBT growth on InPOSi
Journal article2026, MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 212, p.110771Publication Optimization of the MuGFET performance on super critical-strained SOI (SC-SSOI)substrates featuring raised source/drain and dual CESL
Proceedings paper2007, International Symposium on VLSI Technology, Systems, and Applications - VLSI-TSA, 23/04/2007