Browsing by Author "Fan, Xue"
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Publication An In-Depth Study on Device Variability in 22 nm FD-SOI NMOSFETs Under X-Ray Exposure
Journal article2026, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, (73) 2, p.391-399Publication Non-uniformities in MOSFET-array characteristics caused by probe-induced mechanical stress
Proceedings paper2025, IEEE 37th International Conference on Microelectronic Test Structures (ICMTS), 2025-03-24, p.68-73