Browsing by Author "Cretu, Bogdan"
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Publication A Low frequency noise characterization in n-channel UTBOX devices with 6 nm Si film
Proceedings paper2013, International Conference on 1/f Noise and Fluctuations - ICNF, 24/06/2013, p.1-4Publication Assessment of DC and low frequency noise performances of triple-gate FinFETs at cryogenic temperatures
Journal article2016, Semiconductor Science and Technology, (31) 12, p.124006Publication DC and low frequency noise performances of SOI p-FinFETs at very low temperature
Publication Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures
Journal article2018, Solid-State Electronics, 143, p.27-32Publication Discussion of the flicker noise origin at very low temperature and polarization operation
Proceedings paper2019, 25th Int. Conf on Noise and 1/f Fluctuations, 18/06/2019, p.45-48Publication Discussion on the 1/f noise behavior in Si gate-all-around nanowire MOSFETs at liquid helium temperatures
Proceedings paper2018, Joint International EUROSOI Workshop and International Conference on Ultimate Silicon Integration- EUROSOI-ULIS, 19/03/2018, p.1-4Publication Discussion on the figures of merit of identified traps located in the Si flm: surface versus volume trap densities
Proceedings paper2020, 237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19, 10/05/2020, p.45-51Publication Impact of defects on transport in nanodevices
Meeting abstract2018, E-MRS Spring Meeting Symposium G: Carrier Transport, Photonics and Sensing in Group IV-based and Other Semiconductors ..., 18/06/2018, p.G.8.6Publication Improved physics-based analysis to discriminate the flicker noise origin at very low temperature and drain voltage polarization
Journal article2020, Solid-State Electronics, 171, p.107771Publication In-depth static and low-frequency noise characterization of n-channel FinFETs on SOI substrates at cryogenic temperature
Publication Lessons learned from low-frequency noise studies on fully depleted UTBOX silicon-on-insulator MOSFETs
Proceedings paper2013, Advanced Semiconductor-on-Insulator Technology and Related Physics 16, 12/05/2013, p.49-61Publication Low frequency noise analysis and modeling in vertical tunnel FETs with Ge Source
Publication Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
Proceedings paper2019, 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), 1/04/2019Publication Low frequency noise analysis on Si/SiGe superlattice I/O n-channel FinFETs
Journal article2020, Solid-State Electronics, 168, p.107732Publication Low frequency noise assessment in n- and p-channel sub-10 nm triple-gate FinFETs. Part I: Theory and methodology
Journal article2017, Solid-State Electronics, (128) 1, p.102-108Publication Low frequency noise spectroscopy methodology for identifying traps located in the Si film of advanced mosfets
Journal article2026, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, (41) 7, p.075011Publication Low frequency nosie spectroscopy in rotated UTBOX nMOSFETs
Proceedings paper2015, International Conference on Noise and Fluctuations - ICNF, 1/06/2015, p.1-4Publication Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets
Proceedings paper2021, Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS), SEP 01-03, 2021Publication Low temperature noise spectroscopy of p-channel SOI FinFETs
Proceedings paper2014, 10th Workshop on the Thematic Network on Silicon on Insulator Technology, Devices and Circuits - EUROSOI, 26/01/2014, p.1-2Publication Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics